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C.3 Wave phenomena

Syllabus
First assessment 2025
Topic
Level
HL

Model Wavefronts and Rays

Define a wavefront

A wavefront is a line or surface joining points that are in phase. Adjacent wavefronts are separated by one wavelength. In a uniform medium, the wavefronts are perpendicular to the direction of propagation.

Use rays to show propagation

A ray is a line showing the direction in which the wave transfers energy. Draw rays perpendicular to the local wavefronts; straight, parallel wavefronts give parallel rays, while circular wavefronts from a point source give radial rays.

Read the geometry

When a wavefront diagram changes direction at a boundary, compare the ray direction and the spacing of wavefronts on each side. The wavefront construction helps distinguish a change in speed from a change in frequency.

Common trap

Do not draw rays parallel to wavefronts. A ray follows energy propagation and is normal to the wavefront at each point.

C.3.1 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

The packet contains one directly relevant ray-diagram item and one unrelated polarization item. Use the ray evidence for diagram construction; no reliable frequency claim is made for the unrelated item.

Command terms

Sketch / Label

What earns marks

Define wavefronts as in-phase lines or surfaces and draw rays perpendicular to them in the propagation direction. For a diagram question, label the image or ray construction only after identifying the correct normal direction.

Watch for

Drawing rays along wavefronts instead of perpendicular to them, or treating the mixed polarization evidence as a wavefront question.

Representative question

Question 1

[Maximum number: 3]

Sketch two appropriate rays on the diagram to show the formation of the image. Label the image with the letter I.

Apply Snell’s Law

Write the boundary relationship

For a ray crossing from medium 1 to medium 2, Snell’s law is n1sinθ1=n2sinθ2n_1\sin\theta_1=n_2\sin\theta_2. Each angle is measured between the ray and the normal, not between the ray and the surface.

Solve the geometry first

Draw or identify the normal at the boundary, label incident and refracted angles, then substitute the refractive indices and sines. If the question asks for speed, combine the result with n=c/vn=c/v.

Check the bend

Entering a higher-index medium decreases speed and bends the ray toward the normal. Entering a lower-index medium increases speed and bends it away from the normal; the frequency remains fixed at a stationary boundary.

Common trap

Do not use the angle between a wavefront and the normal as if it were the ray angle. A wavefront is perpendicular to the ray, so convert the angle when the diagram labels wavefronts.

C.3.2 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

Questions ask you to calculate light speed in water or select the correct refractive-index expression from a wavefront diagram. The evidence rewards the normal-angle convention and correct sine ratio.

Command terms

Calculate / What is

What earns marks

Measure each angle from the normal, write n1 sinθ1 = n2 sinθ2, and substitute the correct refractive indices. If speed is requested, use n = c/v and keep significant figures appropriate.

Watch for

Using angles measured from the surface, or reversing n1 and n2 when applying Snell’s law.

Representative question

Question 1

[Maximum number: 3]

Calculate the speed of light in the water. State the answer to an appropriate number of significant figures.

Calculate Refractive Index

Define refractive index

The refractive index of a medium is n=c/vn=c/v, where cc is the speed of light in vacuum and vv is its speed in the medium. A larger nn means a lower light speed in that medium.

Relate speed and wavelength

At a stationary boundary the frequency is unchanged. Since v=fλv=f\lambda, a lower speed means a shorter wavelength. For two media, n2/n1=λ1/λ2n_2/n_1=\lambda_1/\lambda_2 when the frequency is common.

Use a graph or measurement

If a graph’s gradient represents nn, state that interpretation before reading the value. For uncertainty, use the spread from suitable maximum and minimum lines or the specified uncertainty method.

Common trap

Do not use n=v/cn=v/c, and do not assume wavelength stays fixed when light enters a different medium. Frequency is the quantity that remains fixed at a stationary boundary.

C.3.3 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

Questions ask for a refractive index from a graph or compare refractive indices using wavelengths in two media. The evidence rewards the inverse speed relationship and correct wavelength ratio.

Command terms

Determine

What earns marks

Use n = c/v, or compare wavelengths through n2/n1 = λ1/λ2 when frequency is unchanged. If a graph is used, identify what its gradient represents and report the refractive index with appropriate absolute uncertainty.

Watch for

Using the speed ratio in the wrong direction or reporting a graph gradient without explaining that it represents n.

Representative question

Question 1

[Maximum number: 2]

Determine the value of the refractive index of the glass with its absolute uncertainty.

Calculate Critical Angle and Total Internal Reflection

Check the two conditions

Total internal reflection can occur only when a wave travels from a higher-index medium to a lower-index medium, and the incidence angle is greater than the critical angle. At the critical angle, the refracted ray travels along the boundary: θ2=90\theta_2=90^\circ.

Calculate the critical angle

From Snell’s law, sinθc=n2/n1\sin\theta_c=n_2/n_1 for n1>n2n_1>n_2. For a dense medium to air, n21n_2\approx1, so sinθc=1/n1\sin\theta_c=1/n_1.

Use the boundary picture

For incidence below θc\theta_c, there is a refracted ray. At θc\theta_c, it grazes the boundary. Above θc\theta_c, no refracted ray propagates into the lower-index medium and all the light is reflected back into the denser medium.

Common trap

Do not use the critical-angle equation when light travels from lower to higher refractive index, and do not measure the critical angle from the surface rather than the normal.

C.3.4 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

Questions ask you to calculate a critical angle or infer a medium’s light speed from θc. The evidence rewards the Snell’s-law boundary condition and correct inverse-sine calculation.

Command terms

Calculate / What is

What earns marks

Confirm that the ray goes from higher n1 to lower n2, set the refracted angle to 90° at the threshold, and use sin θc = n2/n1. For a dense medium to air, use sin θc = 1/n1 and check that incidence above θc gives total internal reflection.

Watch for

Using n1/n2 instead of n2/n1 in sin θc, or applying total internal reflection when the ray travels into the higher-index medium.

Representative question

Question 1

[Maximum number: 2]

Calculate the critical angle for the plastic-water interface.

Apply Superposition

Add overlapping displacements

When waves overlap, the resultant displacement at a point is the algebraic sum of the individual displacements: yresultant=y1+y2y_{\mathrm{resultant}}=y_1+y_2. The waves then continue propagating after the overlap.

Keep the signs

Displacements on the same side of equilibrium add; opposite displacements partially or completely cancel. Equal opposite pulses can produce zero displacement at an instant without destroying either wave.

Connect to interference

Repeated superposition of coherent waves can create stable maxima and minima. A diffraction pattern extending beyond a geometrical shadow is evidence that wave overlap and interference are involved.

Common trap

Do not add amplitudes as positive magnitudes only, and do not treat destructive interference as permanent disappearance of the waves.

C.3.5 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

Questions ask for a resultant displacement or explain why a diffraction pattern supports the wave model. The evidence rewards signed addition and an explicit link between maxima/minima and interference.

Command terms

Explain / What is

What earns marks

Add the signed displacements at the specified point and time. Use constructive addition for same-sign displacements and cancellation for opposite-sign displacements; then connect maxima/minima to interference or diffraction evidence.

Watch for

Adding amplitudes as magnitudes and ignoring the sign of each displacement at the stated time.

Representative question

Question 1

[Maximum number: 2]

Early theories of light suggest that a geometrical shadow of the slit will be observed on the screen. Explain how the diffraction pattern formed on the screen provides evidence for the wave theory of light.

Explain Coherent Sources

Define coherence

Two waves are coherent if they have the same frequency and a constant phase difference. The phase relationship does not drift with time.

Connect coherence to a pattern

When coherent waves overlap, the locations of constructive and destructive interference remain fixed, producing a stable interference pattern. An ordinary pair of independent light sources usually has a changing phase relationship and does not produce a stable pattern.

Use one source when needed

A single source split into two paths can provide a common frequency and phase relationship. The resulting secondary sources can then act coherently for a double-source interference experiment.

Common trap

Same frequency alone is not enough. The phase difference must also remain constant; otherwise bright and dark locations move or wash out over time.

C.3.6 Exam Analysis

Assessment in practice

1–2 marks
How it is assessed

Questions ask why two sources need to be coherent. The evidence repeatedly rewards constant phase difference and the resulting fixed pattern, often with a single source split into two paths.

Command terms

Explain

What earns marks

State both conditions for coherence: same frequency and constant phase difference. Then link the fixed phase relationship to a stable bright/dark interference pattern, and explain why independent sources usually fail.

Watch for

Mentioning only equal frequency and omitting the requirement that phase difference remains constant.

Representative question

Question 1

[Maximum number: 2]

Explain why the two sources need to be coherent for the interference pattern to be observed.

Use Path Difference for Interference

Define path difference

Path difference is the difference between the distances travelled by two waves from their sources to the same observation point. For in-phase coherent sources, it determines whether the waves arrive in phase or out of phase.

Apply the conditions

Constructive interference occurs when path difference =nλ=n\lambda. Destructive interference occurs when path difference =(n+12)λ=(n+\tfrac12)\lambda, where nn is a whole number.

Count fringes carefully

Start from the central bright fringe when the path difference is zero. Each additional bright fringe changes the path difference by λ\lambda; dark fringes lie halfway between adjacent bright conditions.

Common trap

Do not assign λ/2\lambda/2 to every dark point. The first dark condition is λ/2\lambda/2, then 3λ/23\lambda/2, 5λ/25\lambda/2, and so on.

C.3.7 Exam Analysis

Assessment in practice

1 marks
How it is assessed

Questions ask for path difference at a dark fringe after a stated number of bright or dark fringes. The evidence rewards counting from the central maximum and choosing the half-integer condition for darkness.

Command terms

What is

What earns marks

Identify the central bright condition as zero path difference, count the bright/dark fringes between the reference and target points, and apply nλ for bright or (n + 1/2)λ for dark.

Watch for

Choosing an integer multiple of λ for a dark fringe or losing the extra half-cycle when counting intervening fringes.

Representative question

Question 1

[Maximum number: 1]

In a double-slit experiment using coherent light of wavelength λ\lambda, the central bright fringe is observed on a screen at point P. A point of destructive interference occurs at point Q. Only one point of constructive interference is observed between P and Q.

What is the path difference at Q ?

A

λ2\frac{\lambda}{2}

B

λ\lambda

C

3λ2\frac{3 \lambda}{2}

D

2λ2 \lambda

Model Two-Source Interference

Set up two-source interference

Two coherent sources emit waves with the same frequency and a constant phase difference. At each observation point, compare the two source-to-point distances to find the path difference.

Map bright and dark regions

For in-phase sources, path difference nλn\lambda gives constructive interference and a bright or high-amplitude region. Path difference (n+12)λ(n+\tfrac12)\lambda gives destructive interference and a dark or low-amplitude region.

Read the pattern

Points equidistant from the two sources have zero path difference and form a central constructive line. Further maxima and minima occur where the path difference changes by half-wavelength steps.

Common trap

Do not use source-to-source separation as the path difference. It is the difference between the two travel distances to the same observation point.

C.3.8 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

Questions ask for a possible wavelength from a sound minimum or ask you to explain a bright/dark screen pattern. The evidence rewards identifying the phase at arrival and applying the correct half- or whole-wavelength condition.

Command terms

What is / Explain

What earns marks

Find the two source-to-point distances and subtract them to obtain path difference. For in-phase coherent sources, use nλ for constructive interference and (n + 1/2)λ for destructive interference; explain the observed bright/dark pattern.

Watch for

Using the path length to one source instead of subtracting the two paths, or assigning a bright fringe to a half-integer path difference.

Representative question

Question 1

[Maximum number: 1]

Two loudspeakers are driven in phase and emit sound of the same frequency. A minimum intensity of sound is detected at point P.

P is 4.0 m from one loudspeaker and 4.6 m from the other.

What is a possible wavelength of the sound?

A

20 cm

B

30 cm

C

40 cm

D

60 cm

Use Young’s Double-Slit Equation

Relate fringe spacing to the apparatus

For Young’s double-slit interference, fringe separation is s=λD/ds=\lambda D/d, where λ\lambda is wavelength, DD is slit-to-screen distance and dd is slit separation.

Rearrange before substituting

Use λ=sd/D\lambda=sd/D, d=λD/sd=\lambda D/s, or D=sd/λD=sd/\lambda as needed. Measure the separation between adjacent bright or dark fringe centres; if several fringes are measured, divide the total width by the number of intervals.

Check the trends

Fringes spread farther apart when wavelength or screen distance increases, and become closer when slit separation increases. The small-angle model assumes DdD\gg d and approximately plane wavefronts normal to the slits.

Common trap

Do not use the total width across several fringes as s without dividing by the number of fringe spacings, and do not confuse slit separation d with screen distance D.

C.3.9 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

Questions ask you to calculate wavelength from a measured pattern or identify which colour gives the largest fringe separation. The evidence rewards λ = sd/D and the correct wavelength trend.

Command terms

Calculate / What is

What earns marks

Use s = λD/d, rearrange to the requested variable, convert units, and divide a measured multi-fringe width by its number of intervals. Check that longer wavelength gives larger fringe separation.

Watch for

Using total pattern width as one fringe spacing or reversing d and D in λ = sd/D.

Representative question

Question 1

[Maximum number: 3]

Calculate, in nm,λ\mathrm{nm}, \lambda.

Model Thin-Film Interference

Compare the reflected rays

In thin-film interference, light reflects from the top and bottom surfaces of a film. The two reflected rays have a path difference from the extra distance travelled inside the film and may also acquire a phase change on reflection.

Account for phase changes

Determine whether each reflection introduces a phase reversal, then combine that phase difference with the optical path difference. For normal incidence, the geometric contribution is approximately 2nt2nt, where nn is film refractive index and tt is thickness.

Choose the correct interference condition

Use the phase-shift situation stated in the problem to decide whether the total condition for constructive reflection is an integer or half-integer number of wavelengths. For an air–film–air setup with one phase reversal, the minimum constructive thickness is t=λ/(4n)t=\lambda/(4n).

Common trap

Do not apply a single formula without checking the refractive indices at both reflecting surfaces. A phase reversal can swap the bright and dark conditions.

C.3.10 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

Questions ask for a missing reflected wavelength or the minimum film thickness for constructive reflection. The evidence rewards including refractive index and the correct phase-shift condition.

Command terms

Determine / What is

What earns marks

Draw or identify the top and bottom reflected rays, calculate the optical path contribution 2nt at normal incidence, and count phase reversals before selecting the constructive condition. For the air–film–air minimum-thickness case, use t = λ/(4n).

Watch for

Using 2t instead of 2nt, or applying the air–film–air quarter-wave result without checking the phase changes at the two surfaces.

Representative question

Question 1

[Maximum number: 3]

The refractive index of the coating is 1.63 and the refractive index of the glass is 1.52 .

The thickness of the coating is 143 nm .
Determine the wavelength, in nm , that is missing in the light reflected to the girl assuming that the light is incident normally on the window.

Apply Resolution and the Rayleigh Criterion

Understand the diffraction limit

A finite aperture produces a diffraction pattern rather than a perfect point image. Two nearby sources are resolved only when their diffraction patterns are sufficiently separated. Resolution is therefore limited by wavelength and aperture size.

State Rayleigh’s criterion

Two point sources are just resolved when the central maximum of one diffraction pattern lies on the first minimum of the other pattern. At smaller angular separation the patterns overlap too strongly to distinguish the sources.

Improve resolution

Use a shorter wavelength or a larger aperture. For visible light, violet light has a shorter wavelength than red light and can resolve closer sources under the same aperture conditions.

Common trap

Do not say that the two central maxima must coincide. Rayleigh’s limit is defined by one central maximum aligning with the other pattern’s first minimum.

C.3.11 Exam Analysis

Assessment in practice

1–2 marks
How it is assessed

Questions ask you to state the criterion or choose an aperture/wavelength change that resolves two sources. The evidence rewards the exact central-maximum/first-minimum relationship and the violet-light choice.

Command terms

State / Which change

What earns marks

State the Rayleigh criterion using the central maximum and first minimum, then identify the change that improves angular resolution. A shorter wavelength or larger aperture reduces the minimum resolvable separation.

Watch for

Claiming that longer-wavelength red light improves resolution or misquoting the two-pattern condition.

Representative question

Question 1

[Maximum number: 1]

State the Rayleigh criterion for resolution.

Model Single-Slit Diffraction

HL only

Recognize the pattern

A monochromatic wave passing through a narrow rectangular slit spreads and forms a broad central maximum with weaker side maxima separated by minima. The pattern results from interference between contributions across the slit.

Use the first-minimum condition

For slit width bb, the first minimum satisfies θλ/b\theta\approx\lambda/b for small angles. On a screen a distance xx away, the central maximum width is approximately 2xλ/b2x\lambda/b.

Check the trends

A narrower slit or longer wavelength produces greater angular spreading and a wider central maximum. A wider slit or shorter wavelength produces a narrower pattern. The syllabus treatment is monochromatic light and rectangular slits at normal incidence.

Common trap

Do not confuse the distance from the central maximum to the first minimum with the full central-maximum width; the latter is twice the first-minimum distance on the screen.

C.3.12 (HL) Exam Analysis

HL only

Assessment in practice

1–2 marks
How it is assessed

Questions ask you to find wavelength from an intensity graph or choose the width of the central maximum. The evidence rewards λ = bθ and 2xλ/b, with the factor of two handled correctly.

Command terms

Calculate / What is

What earns marks

Read the first intensity minimum, use θ ≈ λ/b, and multiply by the slit-to-screen distance when the question asks for central-maximum width. Check whether the requested width is one-sided or the full width.

Watch for

Using λ/b as the full central-maximum width on the screen and omitting the factor 2x.

Representative question

Question 1

[Maximum number: 2]

The graph shows the variation with diffraction angle θ\theta of the intensity I on the screen.

\(I / \mathrm{Wm

The slit width is 1.3×105 m1.3 \times 10^{-5} \mathrm{~m}. Calculate the wavelength of the light.

Read the Diffraction Envelope

HL only

Separate the two patterns

In a multiple-slit intensity pattern, the fine interference maxima are contained within a broad single-slit diffraction envelope. The envelope sets the overall intensity scale; the double-slit or multiple-slit interference determines the rapid fringe structure.

Relate the widths

The single-slit envelope depends on slit width bb, while the separation of fine interference maxima depends on source or slit separation dd. A smaller bb makes the envelope wider; a larger dd makes interference fringes closer together.

Explain missing or unequal maxima

Interference maxima at different angles can have different intensities because the envelope changes across the screen. Some interference maxima may fall at an envelope minimum and disappear.

Common trap

Do not treat every interference maximum as having the same height, and do not confuse the fine fringe spacing with the width of the single-slit envelope.

C.3.13 (HL) Exam Analysis

HL only

Assessment in practice

1–2 marks
How it is assessed

Questions ask you to identify λ/d and λ/b from an intensity graph or explain why different maxima have different heights. The evidence rewards separating the fine structure from the broad envelope.

Command terms

What are / Outline

What earns marks

Identify the broad single-slit envelope separately from the fine interference fringes. Use b for envelope width and d for fringe spacing, then explain unequal or missing maxima as envelope modulation.

Watch for

Attributing unequal maxima only to source brightness and ignoring the single-slit diffraction envelope.

Representative question

Question 1

[Maximum number: 1]

Light of wavelength λ\lambda is incident on two parallel slits of width b that are separated by distance d. The graph of intensity against diffraction angle is shown.

diffraction angle/rad

What are λd\frac{\lambda}{d} and λb\frac{\lambda}{b} ?

λd\frac{\lambda}{d}

λb\frac{\lambda}{b}

0.1

0.1

0.1

0.01

0.01

0.1

0.01

0.01

Model Diffraction Gratings

HL only

Core idea

A diffraction grating has many equally spaced parallel slits. Bright principal maxima occur when the path difference between adjacent slits is an integer number of wavelengths:

nλ=dsinθn\lambda=d\sin\theta

Here, nn is the order number 0,1,2,0,1,2,\ldots, λ\lambda is the wavelength, dd is the spacing between adjacent slits, and θ\theta is measured from the central maximum to the chosen maximum.

Build the model

If a grating has NN lines per metre, the slit spacing is d=1/Nd=1/N. For a selected maximum, identify its order nn, convert dd and λ\lambda to consistent units, and solve for the unknown angle, wavelength or spacing. The central maximum is n=0n=0; the first maxima on either side are n=1n=1.

Check the allowed orders

Because sinθ1\lvert\sin\theta\rvert\le 1, a wavelength can only produce orders satisfying nλdn\lambda\le d. The largest possible order is therefore the greatest integer not exceeding d/λd/\lambda. For overlapping wavelengths, equate their path-difference conditions: if the second-order maximum of λ1\lambda_1 coincides with the third-order maximum of λ2\lambda_2, then 2λ1=3λ22\lambda_1=3\lambda_2.

Common trap

Do not use the number of lines per metre as dd; invert it first. Do not count the central maximum as first order, and do not replace the grating equation with the small-angle approximation unless the question explicitly permits that approximation.

C.3.14 (HL) Exam Analysis

HL only

Assessment in practice

1 marks
How it is assessed

The evidence includes coincidence of maxima from two wavelengths and counting the number of possible transmitted maxima for a stated line spacing. Both require identifying order correctly and applying nλ=d sinθ or its sinθ≤1 limit.

Command terms

Determine / Calculate

What earns marks

Identify the order and adjacent-line spacing, convert all quantities to SI units, use nλ=d sinθ, and apply the order limit nλ≤d before selecting or reporting an answer.

Watch for

Using line density as d, mislabelling the central or first-order maximum, or counting an order that violates nλ≤d.

Representative question

Question 1

[Maximum number: 1]

Monochromatic light of wavelength λ\lambda is incident normally on a diffraction grating. The adjacent lines of the diffraction grating are separated by a distance of 2.8λ2.8 \lambda. How many diffraction maxima are present in the transmitted light?

A

2

B

3

C

5

D

7

Retrieve the Core C.3 Wave Phenomena Model

C.3 Wave phenomena is secure when you can connect the physical picture to the equation and its limits.

  • Wavefronts and rays
  • Reflection, refraction and Snell’s law
  • Refractive index and total internal reflection
  • Superposition, coherent sources and interference
  • Young’s double-slit pattern

Retrieve the HL C.3 Wave Phenomena Model

HL only

The HL extension is secure when you can model diffraction as interference and read the limits of the pattern.

  • Single-slit diffraction: b sinθ = nλ for minima
  • Diffraction envelopes in multiple-slit patterns
  • Diffraction grating maxima: nλ=d sinθ
  • Allowed orders satisfy nλ≤d
ConceptIB Physics HL