C.3.4—Total internal reflection

Syllabus
First assessment 2025
Objective
Level
SL

Calculate Critical Angle and Total Internal Reflection

Check the two conditions

Total internal reflection can occur only when a wave travels from a higher-index medium to a lower-index medium, and the incidence angle is greater than the critical angle. At the critical angle, the refracted ray travels along the boundary: θ2=90\theta_2=90^\circ.

Calculate the critical angle

From Snell’s law, sinθc=n2/n1\sin\theta_c=n_2/n_1 for n1>n2n_1>n_2. For a dense medium to air, n21n_2\approx1, so sinθc=1/n1\sin\theta_c=1/n_1.

Use the boundary picture

For incidence below θc\theta_c, there is a refracted ray. At θc\theta_c, it grazes the boundary. Above θc\theta_c, no refracted ray propagates into the lower-index medium and all the light is reflected back into the denser medium.

Common trap

Do not use the critical-angle equation when light travels from lower to higher refractive index, and do not measure the critical angle from the surface rather than the normal.

C.3.4 Exam Analysis

Assessment in practice

1–3 marks
How it is assessed

Questions ask you to calculate a critical angle or infer a medium’s light speed from θc. The evidence rewards the Snell’s-law boundary condition and correct inverse-sine calculation.

Command terms

Calculate / What is

What earns marks

Confirm that the ray goes from higher n1 to lower n2, set the refracted angle to 90° at the threshold, and use sin θc = n2/n1. For a dense medium to air, use sin θc = 1/n1 and check that incidence above θc gives total internal reflection.

Watch for

Using n1/n2 instead of n2/n1 in sin θc, or applying total internal reflection when the ray travels into the higher-index medium.

Representative question

Question 1

[Maximum number: 2]

Calculate the critical angle for the plastic-water interface.

Retrieve the Core C.3 Wave Phenomena Model

C.3 Wave phenomena is secure when you can connect the physical picture to the equation and its limits.

  • Wavefronts and rays
  • Reflection, refraction and Snell’s law
  • Refractive index and total internal reflection
  • Superposition, coherent sources and interference
  • Young’s double-slit pattern